Method of learning a knowledge-based database used in...

Details Method of learning a knowledge-based database used in... Method of learning a knowledge-based database used in...

2004-06-03

2009-11-24

Chawan, Sheela C (Department: 2624)

Image analysis

Applications

Manufacturing or product inspection

C382S149000, C715S835000, C715S837000, C356S237100

Reexamination Certificate

active

07623698

ABSTRACT:
The invention relates to a method of learning a knowledge-based database used in automatic defect classification. According to this method, the user is spared a series of entries as the system carries out an automatic learn mode, which requires a reduced number of user entries.

REFERENCES:
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patent: 6408219 (2002-06-01), Lamey et al.
patent: 6456899 (2002-09-01), Gleason et al.
patent: 6483938 (2002-11-01), Hennessey et al.
patent: 6792367 (2004-09-01), Hosoya et al.
patent: 6973209 (2005-12-01), Tanaka

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