Method of laser crystallization

Single-crystal – oriented-crystal – and epitaxy growth processes; – Processes of growth with a subsequent step of heat treating...

Reexamination Certificate

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C117S037000

Reexamination Certificate

active

07083676

ABSTRACT:
At least one amorphous silicon island is formed on a substrate first. A first step and a second step laser crystallization processes are thereafter performed in sequence. The amorphous silicon island is irradiated with a laser pulse having a first energy density to re-crystallize an edge portion of the amorphous silicon island into a polysilicon structure. The amorphous silicon island is then irradiated with a laser pulse having a second energy density to re-crystallize a center portion of the amorphous silicon island into a polysilicon structure.

REFERENCES:
patent: 4662949 (1987-05-01), Inoue et al.
patent: 5382537 (1995-01-01), Noguchi
patent: 5803965 (1998-09-01), Yoon
patent: 5932003 (1999-08-01), Naomoto et al.
patent: 6080236 (2000-06-01), McCulloch et al.
patent: 6113689 (2000-09-01), Moon
patent: 6143661 (2000-11-01), Kousai et al.
patent: 6176922 (2001-01-01), Aklufi et al.
patent: 6193796 (2001-02-01), Yang
patent: 6241817 (2001-06-01), Jang et al.
patent: 6322625 (2001-11-01), Im
patent: 6375737 (2002-04-01), Shih et al.
patent: 6558802 (2003-05-01), Henley et al.
patent: 2003/0000455 (2003-01-01), Voutsas
patent: WO 97/45827 (1997-12-01), None

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