Optics: measuring and testing – Material strain analysis – By light interference detector
Patent
1993-09-09
1995-11-14
Turner, Samuel A.
Optics: measuring and testing
Material strain analysis
By light interference detector
356345, G01B 902
Patent
active
054671841
ABSTRACT:
A method of deformation measurement using speckle interferometry comprises the steps of forming a series of speckle images at specified time intervals by using an interferometer to superpose a laser beam reflected from the object whose deformation is to be measured and a laser beam not affected by the object, storing the speckle images in a memory as they are formed, using the difference between the speckle image stored before the deformation and a second speckle image stored in the course of the deformation to measure the deformation between the times that the two speckle images were recorded, repeating this process for successive pairs of speckle images up to the one recorded after completion of the deformation, and adding together the individual deformation measurements obtained.
REFERENCES:
patent: 4046477 (1977-09-01), Kaule
patent: 5065331 (1991-11-01), Vachon et al.
patent: 5094528 (1992-03-01), Tyson, II et al.
Agency of Industrial Science & Technology
Ministry of International Trade & Industry
Turner Samuel A.
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