Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1984-03-27
1986-01-14
Levy, Stewart J.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
324158R, G01R 3126
Patent
active
045648077
ABSTRACT:
A method for judging whether a group of semiconductor devices have sufficiently short carrier lifetimes to make them suitable for use in high speed electronic circuitry. A determination is made as to the satisfactory carrier lifetime for a pn junction in the devices. A capacitance value representative of the pn junction, when reverse biased, is also determined. The pn junction is placed in series with an inductor sized so that the resonant frequency of the inductor and the pn junction, when reversely biased, is substantially equal to the reciprocal of the carrier lifetime. An oscillating voltage is applied to the series combination of the junction and the inductor, the voltage having a fundamental frequency near but above the resonant frequency and an amplitude greater than a predetermined level which is in the range of 3-5 volts. Finally, the device under test is rejected should an output taken across the pn junction show a substantial frequency component below the fundamental frequency.
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Ikezi, H. et al., "Observation of Multiple-Valued Attractors and Crises in a Driven Nonlinear Circuit", Phys. Rev. A, vol. 28, Aug. 1983, pp. 1207-1209.
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Freeman Richard L.
Ikezi Hiroyuki
Baker Stephen M.
GA Technologies Inc.
Levy Stewart J.
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