Method of inspection for inner defects of an object and...

Details Method of inspection for inner defects of an object and... Method of inspection for inner defects of an object and...

2011-04-26

2011-04-26

Chang, Jon (Department: 2624)

Image analysis

Applications

Manufacturing or product inspection

C700S110000, C708S004000

Reexamination Certificate

active

07933441

ABSTRACT:
It is made possible to conduct inner defect inspection using spatial discrete data such as X-ray CT data with higher precision. An inner defect inspection method for inspecting inner defects in an object on the basis of spatial discrete data which describe spatial shape and structure of the object by using spatial elements includes the steps of: extracting an inner defect from the spatial discrete data by using an inner defect extraction unit, collecting the elements included in a neighborhood range, which is set with a predetermined spread around the inner defect extracted by the inner defect extraction unit, as related elements by using a related element collection unit; and measuring feature quantities such as a size and a position of center of gravity of the inner defect on the basis of the related elements collected by the related element collection unit, by using a feature quantity measurement unit.

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Japanese Office Action dated Sep. 29, 2009, issued in corresponding Japanese Patent Application No. 2004-313483.

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