Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Using radiant energy
Patent
1992-07-30
1994-05-03
Wieber, Kenneth A.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Using radiant energy
324537, 324702, 324158F, 340600, 382 8, G01R 3102, G06K 900
Patent
active
053091086
ABSTRACT:
The invention relates to a method of inspecting and correcting a thin film transistor liquid crystal substrate and an apparatus therefor, where a plurality of scan lines and signal lines are connected electrically in common at each one terminal side respectively, and an infrared image outside the pixel domain is detected after lapse of a prescribed time from the time point of applying voltage between the scan lines and the signal lines, and an infrared image outside the pixel domain is detected after lapse of a prescribed time from the time point of stopping the voltage application, and the scan lines and the signal lines relating to variation of the heating state are detected from difference or quotient between an infrared image at the voltage applying state and an infrared image at the stopping state of voltage application, thereby a pixel address with a shortcircuit defect occurring is specified. If an image part being equal to the set threshold value or more does not exist in the difference infrared image in the pixel address, a wiring pattern position in the pixel address is detected from a visible image of the pixel address, and this wiring pattern and one from a neighboring pixel address are compared to detect a short circuit defect which can be removed by laser.
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Kubota Hitoshi
Maeda Shunji
Ono Makoto
Hitachi , Ltd.
Tobin Christopher
Wieber Kenneth A.
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