Method of inspecting thin-film magnetic head and method of...

Details Method of inspecting thin-film magnetic head and method of... Method of inspecting thin-film magnetic head and method of...

2006-07-11

2006-07-11

Tokar, Michael (Department: 2862)

Electricity: measuring and testing

Magnetic

Magnetic information storage element testing

C324S212000

Reexamination Certificate

active

07075294

ABSTRACT:
In the method of inspecting a thin-film magnetic head, a thin-film magnetic head provided with a magnetoresistive film having a free layer whose magnetization direction changes depending on an external magnetic field and ferromagnetic layers for applying a bias magnetic field to the free layer is prepared. Then, a DC magnetic field is applied to the ferromagnetic layers in the bias magnetic field applying direction. Subsequently, an AC magnetic field is applied to the ferromagnetic layers in the bias magnetic field applying direction. Thereafter, an external magnetic field is applied to the magnetoresistive film while supplying a current thereto, and a property of the thin-film magnetic head such as asymmetry and reproducing output is inspected.

REFERENCES:
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patent: A 06-150264 (1994-05-01), None
patent: 06203339 (1994-07-01), None
patent: A 10-242544 (1998-09-01), None
patent: A 2000-260012 (2000-09-01), None
patent: 2002230728 (2002-08-01), None

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