Method of inspecting optical waveguide substrate for optical...

Details Method of inspecting optical waveguide substrate for optical... Method of inspecting optical waveguide substrate for optical...

2006-09-12

2006-09-12

Nguyen, Tu T. (Department: 2877)

Optics: measuring and testing

For optical fiber or waveguide inspection

Reexamination Certificate

active

07106426

ABSTRACT:
There is disclosed a method of inspecting an optical waveguide substrate for optical conduction at an increased inspecting rate and also inspecting an optical waveguide substrate for cross-talk. According to the disclosed method, a laser beam is applied from a laser beam scanning optical system to one end face of an optical waveguide of an optical waveguide substrate which is an object to be inspected, and the laser beam emitted from the other end of the optical waveguide is detected by a CCD camera, which output detected result data. A light spot position confirming device compares the detected result data with stored data.

REFERENCES:
patent: 2003/0063852 (2003-04-01), Schiffer et al.
patent: 11-304643 (1999-11-01), None

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