Optics: measuring and testing – Inspection of flaws or impurities
Patent
1998-02-03
2000-06-20
Font, Frank G.
Optics: measuring and testing
Inspection of flaws or impurities
3562391, G01N 2100
Patent
active
060783850
ABSTRACT:
The present invention relates to a method of inspecting a magnetic disc, comprising:
REFERENCES:
patent: 4865445 (1989-09-01), Kuriyama et al.
patent: 5646415 (1997-07-01), Yanagisawa
Yamauchi Takashi
Yoshiyama Ryuichi
Conlin David G.
Daley, Jr. William J.
Font Frank G.
Mitsubishi Chemical Corporation
Nguyen Tu T.
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