Method of inspecting electronic circuit

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location

Reexamination Certificate

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Details

C324S537000, C324S762010, C714S735000, C714S745000

Reexamination Certificate

active

07728601

ABSTRACT:
A method of inspecting an electronic circuit that includes a first integrated circuit and a second integrated circuit formed on a circuit board. The first integrated circuit has a first power source, and an input circuit that has a test signal output section and the second integrated circuit has a second power source and an output circuit that has a signal input section. The method includes steps of: turning on the first and second power sources at prescribed voltage levels; changing voltage level of the first power source; applying a test signal to the signal input section of the second integrated circuit; detecting an output signal of the signal output section of the first integrated circuit; and examining whether there is a sufficient margin in the electronic circuit by comparing the test signal and the output signal.

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patent: A-H05-72260 (1993-03-01), None
patent: A-H05-72280 (1993-03-01), None

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