Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1995-07-12
1996-06-18
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324769, 345 93, 359 57, G01R 104, G01R 3102, G02F 11335
Patent
active
055281630
ABSTRACT:
A method of inspecting cells of liquid crystal displays comprising the first step in which the empty TFTs in the active color LCD arrays are energized to charge the auxiliary pixel capacitor corresponding to the individual electrodes, the charged condition is maintained by deenergizing the TFT's, the electric charge is released through the source and drain of the TFTs and the resistor connected to the ground side thereof by re-energizing the TFTs, and the amount of the discharge is measured and the second step in which the same energizing, deenergizing, re-energizing, charging, discharging and measurement as done in the first step are made on the TFTs filled with a liquid crystal in the active color LCD arrays, the difference between the amounts of discharge measured in the first and second steps is integrated or the time constant of the amount of discharge measured in the first step is deducted from the time constant of the amount of discharge measured in the second step.
REFERENCES:
patent: 5184082 (1993-02-01), Nelson
patent: 5377030 (1994-12-01), Suzuki et al.
patent: 5428300 (1995-06-01), Takahashi et al.
patent: 5465053 (1995-11-01), Edwards
Bowser Barry C.
Tohken Industries Co., Ltd.
Wieder Kenneth A.
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