Image analysis – Applications – Surface texture or roughness measuring
Patent
1994-11-17
1996-10-15
Boudreau, Leo
Image analysis
Applications
Surface texture or roughness measuring
382152, 348128, G06K 900
Patent
active
055662447
ABSTRACT:
A workpiece surface is measured to detect a defective portion with a projection and a depression on the workpiece surface by using an optical inspecting apparatus having a projector for radiating a detecting light towards the workpiece surface and a picturing device for receiving a reflected light from the workpiece surface. A reflected light from the workpiece surface is pictured in a condition in which a focal surface of the picturing device is positioned away from the workpiece surface to the side of the picturing device relative to an entire region of that effective inspecting range of the workpiece surface from which the picturing device can receive the reflected light. The defective portion on the workpiece surface is detected from a dark portion which appears on the image of the picturing device.
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Kato Norihide
Mori Ken-ichiro
Shimizu Tomohide
Boudreau Leo
Honda Giken Kogyo Kabushiki Kaisha
Johns Andrew W.
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