Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1998-05-27
2000-09-26
Metjahic, Safet
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
3241581, G01R 3126
Patent
active
061247243
ABSTRACT:
A method and system are provided for increasing the accuracy of AC parametric testing. The invention provides a method of precisely estimating signal propagation delay time in an integrated circuit testing apparatus, wherein a plurality of signal propagation delay time measurements are taken and additional delay times are estimated by linearly interpolating the measured delays. A desired test point (desired output voltage at a given time) is established. Using a sample device, a slope is established on a time vs. voltage plot for a line through the desired test point. Where a desired test point falls between strobe times on a tester, linear extrapolation is used to calculate what voltages must be tested for at the two bracketing strobe times in order to guarantee the desired performance at the desired test point. One or more devices are then tested for the calculated voltages at the corresponding bracketing strobe times.
REFERENCES:
patent: 5617325 (1997-04-01), Schaefer
patent: 5923676 (1999-07-01), Sunter et al.
Mack Ronald J.
Statovici Mihai G.
Cartier Lois D.
Kobert Russell M.
Metjahic Safet
Tachner, Esq. Adam H.
Xilinx , Inc.
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