Measuring and testing – Gas analysis – Gas chromatography
Patent
1984-11-20
1986-08-26
Kreitman, Stephen A.
Measuring and testing
Gas analysis
Gas chromatography
324 585C, G01N 2200
Patent
active
046075216
ABSTRACT:
A response characteristics of a microwave spectroscopic measuring system is remarkably improved by supplying a carrier to a continuously flowing sample containing a polar substance to be measured quantitatively. The carrier contains a compound having at least similar chemical form to that of the polar substance.
REFERENCES:
patent: 3805148 (1974-04-01), Uehara et al.
patent: 3973186 (1976-08-01), Uehara et al.
H. H. Hausdorff, Vapor Fractometry (Gas Chromatography)-A Powerful New Tool in Chemical Analysis, The Perkin-Elmer Corp., p. 22, Sep. 1955.
Fukuyama Masaru
Hikita Akio
Ijuin Yasuharu
Morikawa Naotake
Saito Tomoo
Kreitman Stephen A.
Sagami Chemical Research Center
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