Method of improving electroluminescent efficiency of a MOS...

Semiconductor device manufacturing: process – Chemical etching – Liquid phase etching

Reexamination Certificate

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C438S029000

Reexamination Certificate

active

06905977

ABSTRACT:
The present invention discloses a method of improving an electroluminescent efficiency of a MOS device by etching a semiconductor substrate thereof. A chemical etching process is performed to remove surface states or surface defects located on the surface of a silicon substrate before a nanoparticle layer and a conducting layer is formed on the silicon substrate, in order that the non-radiative electron-hole recombination centers located on the surface of silicon substrate is suppressed. Accordingly, the percentage of radiative electron-hole recombination is heightened and the electroluminescent efficiency of a MOS light emitting device is drastically enhanced. Advantageously, the chemical etching step is able to create a nanostructure on the surface of the silicon substrate to increase the probability of the collision of electron-hole pairs and phonons, and the electroluminescent efficiency of a MOS light emitting device is improved as well.

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Wolf; Silicon Processing for the VLSI Era vol. 1: Process Technology; 1986; Lattice Press, Sunset Beach, California; pp. 531.
Jaeger; Introduction to Microelectronic Fabrication; Modular Series on Solid State Devices, vol. 5; 1988; Addison-Wesley Publishing Company, Reading, Massachusetts; pp. 14-16.
Lin; SiO2-Nanoparticles Enhancing Si Band-Edge Electroluminescence to Nearly Lasing Actions; Nanotechnology, 2001; IEEE-NANO 2001; Proceedings of the 2001 1st IEEE Conference on Oct. 28-30, 2001; pp. 358-362.

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