Electrophotography – Control of electrophotography process – Control of developing
Reexamination Certificate
2011-06-28
2011-06-28
Grainger, Quana M (Department: 2852)
Electrophotography
Control of electrophotography process
Control of developing
Reexamination Certificate
active
07970304
ABSTRACT:
Flat field uniformity can be improved in images produced by an image development system having a development roller interposed between a supply of developer and an imaging element. A raw feed of developer is supplied from the developer supply to the development roller to produce both a metered feed of developer and an overfeed of developer, which is returned to the supply, from the raw feed. A plurality of mass densities of developer used in the system and a plurality of developer velocities through the system are determined, and respective product values of those developer mass densities and those developer velocities are thereafter calculated or otherwise determined. A maximum value of the respective product values is identified, and the image development system is then operated so that the maximum product value is produced.
REFERENCES:
patent: 4227796 (1980-10-01), Kamp et al.
patent: 4847659 (1989-07-01), Resch, III
patent: 5475469 (1995-12-01), Okada et al.
patent: 5815768 (1998-09-01), Clifton
patent: 6084567 (2000-07-01), Ogawa
patent: 6416916 (2002-07-01), Silence et al.
patent: 6580879 (2003-06-01), Coleman et al.
patent: 6810226 (2004-10-01), Phillips et al.
patent: 6829443 (2004-12-01), Byun et al.
patent: 2009/0080920 (2009-03-01), Carter et al.
patent: 2010/0158547 (2010-06-01), Carling et al.
Eastman Kodak Company
Grainger Quana M
Suchy Donna P.
LandOfFree
Method of improving developed flat field uniformity does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of improving developed flat field uniformity, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of improving developed flat field uniformity will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2703080