Method of improving data retention ability of semiconductor...

Details Method of improving data retention ability of semiconductor... Method of improving data retention ability of semiconductor...

2006-07-18

2006-07-18

Le, Vu A. (Department: 2824)

Static information storage and retrieval

Floating gate

Particular biasing

C365S185280

Reexamination Certificate

active

07079421

ABSTRACT:
This invention is a method of improving a data retention ability of a semiconductor memory device having a plurality of nonvolatile memory cells storing a plurality of memory states. The method includes the steps of: (a) selecting the nonvolatile memory cells in a first memory group each of which accumulates charges higher in level than a first threshold from the plurality of nonvolatile memory cells; (b) extracting the nonvolatile memory cells in a first sub-group each of which accumulates the charges lower in level than a second threshold from the nonvolatile memory cells in the first memory group; and (c) programming the nonvolatile memory cells in the first sub-group until each of the nonvolatile memory cells accumulates the charges higher in level than the second threshold.

REFERENCES:
patent: 5835413 (1998-11-01), Hurter et al.
patent: 6317364 (2001-11-01), Guterman et al.
patent: 6344994 (2002-02-01), Hamilton et al.
patent: 6756268 (2004-06-01), Rudeck et al.
patent: 5-81072 (1993-11-01), None
patent: 5-304277 (1993-11-01), None
patent: 9-97849 (1997-04-01), None
patent: 9-116119 (1997-05-01), None
patent: 2001-156188 (2001-06-01), None
patent: 2001-230332 (2001-08-01), None
patent: 2001-512290 (2001-08-01), None
patent: WO 99/07000 (1999-02-01), None

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