Single-crystal – oriented-crystal – and epitaxy growth processes; – Processes joining independent crystals
Reexamination Certificate
2005-04-05
2005-04-05
Kunemund, Robert (Department: 1765)
Single-crystal, oriented-crystal, and epitaxy growth processes;
Processes joining independent crystals
C117S002000, C117S003000, C117S094000, C117S097000
Reexamination Certificate
active
06875268
ABSTRACT:
A method of preparing a surface of a substrate for bonding by removing oxide and altering the atomic surface of the substrate is described. The method comprises, providing a substrate comprised of a plurality of elements. The substrate is held at an elevated temperature and an over-pressure of gas is allowed to flow over the surface of the substrate. The gas over-pressure is comprised of an element found in the plurality of elements. Holding the substrate at an elevated temperature helps removes essentially all the oxide on the surface of the substrate. However, the elevated temperatures also evaporate certain atoms on the substrate surface and cause other atoms on the substrate surface to migrate. Flowing a gas over the surface of the substrate, helps to replace the atoms which have evaporated thereby preventing movement of other atoms. After removing the oxide, the substrate is allowed to cool. By adjusting the temperature of the substrate when the gas over-pressure is turned off, the surface of the substrate may or may not contains atoms which comprise the gas over-pressure. This allows the surface of the substrate to be essentially oxide free and contain the desired atoms for bonding.
REFERENCES:
patent: 4504007 (1985-03-01), Anderson et al.
patent: 4632295 (1986-12-01), Brusic et al.
patent: 5478005 (1995-12-01), Nguyen
patent: 5988487 (1999-11-01), MacKay et al.
patent: 6375060 (2002-04-01), Silhavy
patent: 0 727 829 (1996-08-01), None
patent: 61-182217 (1986-08-01), None
Abstract of JP 61-182217,Patent Abstracts of Japan, vol. 011, No. 007 (Jan. 9, 1987).
Bengtsson, S., “Semiconductor Wafer Bonding: A Review of Interfacial Properties and Applications,”Journal of Electronic Materials, vol. 21, No. 8, pp 841-862 (1992).
Liau, Z.L., et al., “Wafer fusion: A novel technique for optoelectronic device fabrication and monolithic integration,”Applied Physics Letters, vol. 56, No. 8, pp 737-739 (Feb. 19, 1990).
Takagi, H., et al., “Low-temperature direct bonding of silicon and silicon dioxide by the surface activation method,”Sensors and Actuators A, vol. 70, pp 164-170 (1998).
HRL Laboratories LLC
Kunemund Robert
Ladas & Parry LLC
LandOfFree
Method of improving a surface of a substrate for bonding does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of improving a surface of a substrate for bonding, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of improving a surface of a substrate for bonding will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3387837