Method of implementing a scan flip-flop using an edge-triggered

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Particular stable state circuit

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327212, 326 98, H03K 19017

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active

060231793

ABSTRACT:
A method of implementing a scan flipp for use with logic gates includes configuring the flip-flop into a scan mode or data mode. Then the flip-flop enters the precharge phase in which a dynamic input stage is precharged and a static output stage maintains the output signal from the previous evaluation phase. During the evaluation phase in the normal mode, the dynamic input stage generates an output signal that either remains at a logic high level or else transitions from high-to-low, complementing the logic level of the data signal. During the evaluation phase in the scan mode, the dynamic input stage generates an output signal that either remains at a logic high level or else transitions from high-to-low, complementing the logic level of the scan input signal. The static output stage receives the output signal from the dynamic input stage and the clock signal. During the evaluation phase, the static output stage outputs the complement of the output signal received from the dynamic input stage.

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