Method of implementing a boundary scan chain

Data processing: structural design – modeling – simulation – and em – Emulation – In-circuit emulator

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

714727, G01R 3128

Patent

active

061345172

ABSTRACT:
A method of implementing a boundary scan chain is provided using a programmable IC that includes dedicated boundary scan logic having a programmable boundary scan bit-order. Boundary scan cells are provided, each cell being capable of providing the boundary scan functions associated with one I/O pad. In a mask programmable device, dedicated tracks are provided for adding mask programmable interconnect lines. In other programmable ICs such as FPGAs or PLDs, programmable interconnect lines are provided. In either case, the interconnect lines are used to implement the boundary scan data chain. Using these lines, the programmed device can "swap the order" of I/O cells in the boundary scan data chain, or leave cells out of the chain entirely. In one embodiment, the interconnect lines traverse each cell, programmably connecting the data inputs and outputs of adjacent or non-adjacent boundary scan cells. In other embodiments, the interconnect lines are physically located outside the boundary scan cells, either in a ring between the cell and the core or in the core itself.

REFERENCES:
patent: 4912709 (1990-03-01), Teske et al.
patent: 5267146 (1993-11-01), Shimizu et al.
patent: 5300835 (1994-04-01), Assar et al.
patent: 5321277 (1994-06-01), Sparks et al.
patent: 5394034 (1995-02-01), Becker et al.
patent: 5517646 (1996-05-01), Piccirillo et al.
patent: 5537536 (1996-07-01), Groves
patent: 5550839 (1996-08-01), Buch et al.
patent: 5550843 (1996-08-01), Yee
patent: 5572710 (1996-11-01), Asano et al.
patent: 5651013 (1997-07-01), Iadanza
patent: 5706296 (1998-01-01), Whetsel
patent: 5732246 (1998-03-01), Gould et al.
patent: 5790561 (1998-08-01), Borden et al.
patent: 5812562 (1998-09-01), Baeg
patent: 5870586 (1999-02-01), Baxter
patent: 5991908 (1999-11-01), Baxter et al.
patent: 6020755 (2000-02-01), Andrews et al.
Frake, S. et al., A Scan-Testable Mask Programmable Gate Array for Conversion of FPGA Designs, Proc. of IEEE Custom Integrated Circuits Conf., May 1992, pp. 27.3.1-27.3.4.
S-MOS Systems, "FPGA to ASIC Conversion Program," Oct. 1996.
Bhawmick, S. et al. "Threding a Multiple Scan Path in a VLSI Circuit," New Frontiers in Testing, Int'l Conf., Sep. 1988, pp. 735-743.
Chakraborty, K. et al., "A Programmable Boundary Scan Technique for Board-Level, Parallel Functional Duplex March Testing of Word-Oriented Multiport Static RAMs," ED&TC Proc. European Designs and Test Conference, Mar. 1997, pp. 330-334.
Wilson, Ron, "Xilinx Speeds Submicron-Process Ramp", EE Times, Feb. 3, 1997.
"The Programmable Logic Data Book", available from Xilinx, Inc., 2100 Logic Drive, San Jose, CA 95124, 1994, pp 2-7 through 2-46.
"The XC5200 Logic Cell Array Family Technical Data Booklet" Oct. 1995 (referenced as "XC5200.TM. FPGA Data Sheet") available from Xilinx, Inc., 2100 Logic Drive, San Jose, CA 95124.
"The Hardwire Data Book", (1994), available from Xilinx, Inc., 2100 Logic Drive, San Jose, California 95124.
"The Programmable Logic Data Book", (1996), pp. , 4-47, 4-48, 4-54, 4-80, 4-309, available from Xilinx, Inc., 2100 Logic Drive, San Jose, California 95124.
"The Programmable Logic Data Book", (1993), p. 2-82, available from Xilinx, Inc., 2100 Logic Drive, San Jose, California 95124.
"IEEE Standard Test Access Port and Boundary-Scan Architecture", IEEE Std 1149-1990, Chapters 3 and 10, copyright, 1993, available from The Institute of Electrical and Electronic Engineers, Inc., 345 East 47th Street, New York, NY 10017.
Xilinx Application Note XAPP017 version 1.1 entitled, "Boundary Scan in XC4000 and XC5000 Series Devices", published Jul. 15, 1996, available from Xilinx Inc., 2100 Logic Drive, San Jose, California 95124.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of implementing a boundary scan chain does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of implementing a boundary scan chain, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of implementing a boundary scan chain will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-478465

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.