Image analysis – Pattern recognition – Template matching
Patent
1997-06-03
1999-08-24
Shalwala, Bipin H.
Image analysis
Pattern recognition
Template matching
382191, 382201, 382209, 382278, 382300, G06K 962, G06K 964, G06K 932
Patent
active
059434422
ABSTRACT:
In a template matching method, a region that has a plurality of normalized reference template images as vertex template images in a space of a template-pixel-size dimension is considered, and the vertex template images are linearly interpolated by a parameter w to provide a normalized interpolated template image of a magnitude 1 in the space. Then, matching between the normalized interpolated image and a search image is performed using a normalized correlation therebetween as a similarity measure, by which is obtained a parameter that provides the maximum normalized correlation value, and this normalized correlation value is determined as the maximum one.
REFERENCES:
patent: 4633400 (1986-12-01), Chittineni
patent: 4736437 (1988-04-01), Sacks et al.
patent: 4980614 (1990-12-01), Yamada et al.
patent: 5299269 (1994-03-01), Gaborski et al.
patent: 5373567 (1994-12-01), Takahashi et al.
patent: 5479523 (1995-12-01), Gaborski et al.
patent: 5495537 (1996-02-01), Bedrosian et al.
patent: 5675661 (1997-10-01), Richman et al.
patent: 5675663 (1997-10-01), Koerner et al.
patent: 5687291 (1997-11-01), Smyth
patent: 5754692 (1998-05-01), Kondo et al.
patent: 5774576 (1998-06-01), Cox et al.
Ohara Syuuichi
Okudaira Masashi
Sano Mutsuo
Tanaka Kouichi
Nippon Telegraph and Telephone Corporation
Shalwala Bipin H.
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