Method of image enhancement for the coherence probe microscope w

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer

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356358, 382 43, G01B 902

Patent

active

051121298

ABSTRACT:
A method whereby the image produced in a coherence probe microscope is modified by means of a certain specific additive electronic transformation for the purpose of improving the measurement of selected features. The technique improves measurement accuracy on optically complex materials, in particular it improves the accuracy of linewidth measurement on semiconductor linewidths.

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