Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1990-03-02
1992-05-12
Turner, Samuel
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356358, 382 43, G01B 902
Patent
active
051121298
ABSTRACT:
A method whereby the image produced in a coherence probe microscope is modified by means of a certain specific additive electronic transformation for the purpose of improving the measurement of selected features. The technique improves measurement accuracy on optically complex materials, in particular it improves the accuracy of linewidth measurement on semiconductor linewidths.
Davidson Mark
Kaufman Kalman
Mazor Isaac
KLA Instruments Corporation
Kurtz, II Richard E.
Turner Samuel
LandOfFree
Method of image enhancement for the coherence probe microscope w does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of image enhancement for the coherence probe microscope w, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of image enhancement for the coherence probe microscope w will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2424487