Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-02-08
2005-02-08
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S069000, C702S077000, C375S226000
Reexamination Certificate
active
06853933
ABSTRACT:
A method for identifying spectral impulses applies a window filter to an acquired waveform to produce a filtered waveform, and performs an FFT function on the filtered waveform to produce a spectrum of bins. An estimating window is located on the spectrum and centered on a target bin. Bins adjacent to the target bin are excluded and the remaining bins are used to form a noise estimate. The estimate is compared to the target bin and if the result exceeds a threshold value, a spectral impulse is identified.
REFERENCES:
patent: 20020075951 (2002-06-01), Pearson
Provisional application 60/240,830 filed on Oct. 17, 2000.
Guenther Mark L.
Tan Kan
Lenihan Thomas F.
Tektronix Inc.
Walling Meagan S
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