Method of generating test patterns for logic network devices

Details Method of generating test patterns for logic network devices Method of generating test patterns for logic network devices

1985-11-25

1987-09-22

Fleming, Michael R.

Excavating

371 20, 371 25, 324 73R, G01R 3128

Patent

active

046960066

ABSTRACT:
Nodes and paths for connecting the nodes are used to form a model of at least one logic network. Next, all paths for connecting nodes in the logic network are traced, and the nodes and connecting path segments are sensitized and justified. The sensitizing patterns, when generating test patterns for a sequential circuit wherein the output is a function of a time sequence of inputs, may include a time sequence of sensitizing or input patterns for testing a single path through the network.

REFERENCES:
patent: 4204633 (1980-05-01), Goel
patent: 4216539 (1980-08-01), Raymond
patent: 4236246 (1980-11-01), Skilling
patent: 4493077 (1985-01-01), Agrawal
patent: 4503386 (1985-03-01), DasGupta
patent: 4519078 (1985-05-01), Komonytsky
patent: 4534028 (1985-08-01), Trischler
patent: 4594711 (1986-06-01), Thatte
Prabhakar Goel, "An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits", vol. C-30, No. 3, 3/81.
Satish M. Thatte & Jacob A. Abraham, "User Testing of Microprocessors", 1979.
Kideo Fujiwara & Takeshi Shimono, "On The Acceleration of Test Generation Algorithms", vol. C-32, No. 12, 12-83.
Melvin A. Brener & Arthur D. Friedman, "Test Generation for Sequential Circuits", Published in Computer Science, 1976.
H, Paul Roth, "Diagnosis of Automata Failures: A Calculus and a Method", Jul. 1966.
M. Kawai, H. Shibano, S. Funatsu, S. Kato, T. Kurobe, K. Ookawa & T. Sasaki, "A High Level Test Pattern Generation Algorithm", 1983.

Affiliated with

Also associated with

Rating

Method of generating test patterns for logic network devices does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of generating test patterns for logic network devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of generating test patterns for logic network devices will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2063759