Chemistry: electrical and wave energy – Processes and products – Vacuum arc discharge coating
Patent
1981-12-30
1983-05-31
Demers, Arthur P.
Chemistry: electrical and wave energy
Processes and products
Vacuum arc discharge coating
156643, 156652, 156653, 156657, C23C 1500
Patent
active
043859755
ABSTRACT:
A method of forming a wide deep dielectric filled isolation trench in the surface of a silicon semiconductor substrate by forming a wide plug of chemical vapor deposited silicon dioxide in the trench, filling the remaining unfilled trench portions by chemical vapor depositing a layer of silicon dioxide over the substrate and etching back this layer. The method produces chemically pure, planar wide deep dielectric filled isolation trenches and may also be used to simultaneously produce narrow deep dielectric filled isolation trenches.
REFERENCES:
patent: 3976524 (1976-08-01), Feng
patent: 4073054 (1978-02-01), Kaji et al.
patent: 4092210 (1978-05-01), Hoepfner
patent: 4139442 (1979-02-01), Bondur et al.
patent: 4211582 (1980-07-01), Horng et al.
patent: 4222792 (1980-09-01), Lever et al.
patent: 4234362 (1980-11-01), Riseman
patent: 4307179 (1981-12-01), Chang et al.
patent: 4309812 (1982-01-01), Horng et al.
patent: 4318751 (1982-03-01), Horng
patent: 4338138 (1982-06-01), Caualiere
T. A. Bartush et al., "Dielectric Isolation Planarization", IBM Technical Disclosure Bulletin, vol. 21, No. 5, Oct. 1978, pp. 1868-1869.
Chu Shao-Fu
Ho Allen P.
Horng Cheng T.
Kemlage Bernard M.
Bigel Mitchell S.
Demers Arthur P.
International Business Machines Corp.
LandOfFree
Method of forming wide, deep dielectric filled isolation trenche does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of forming wide, deep dielectric filled isolation trenche, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming wide, deep dielectric filled isolation trenche will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2245146