Method of forming wide, deep dielectric filled isolation trenche

Chemistry: electrical and wave energy – Processes and products – Vacuum arc discharge coating

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156643, 156652, 156653, 156657, C23C 1500

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043859755

ABSTRACT:
A method of forming a wide deep dielectric filled isolation trench in the surface of a silicon semiconductor substrate by forming a wide plug of chemical vapor deposited silicon dioxide in the trench, filling the remaining unfilled trench portions by chemical vapor depositing a layer of silicon dioxide over the substrate and etching back this layer. The method produces chemically pure, planar wide deep dielectric filled isolation trenches and may also be used to simultaneously produce narrow deep dielectric filled isolation trenches.

REFERENCES:
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patent: 4307179 (1981-12-01), Chang et al.
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patent: 4318751 (1982-03-01), Horng
patent: 4338138 (1982-06-01), Caualiere
T. A. Bartush et al., "Dielectric Isolation Planarization", IBM Technical Disclosure Bulletin, vol. 21, No. 5, Oct. 1978, pp. 1868-1869.

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