Method of forming trenches in monocrystalline silicon carbide

Fishing – trapping – and vermin destroying

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

437 35, 437 24, 437 67, 437 38, 148DIG148, H01L 2176, H01L 21266

Patent

active

054361745

ABSTRACT:
A trench is formed in a monocrystalline silicon carbide substrate by amorphizing a portion of the monocrystalline silicon carbide substrate to define an amorphous silicon carbide region therein. The amorphous silicon carbide region is then removed, to produce a trench in the monocrystalline silicon carbide substrate corresponding to the removed amorphous silicon carbide region. The substrate may be amorphized by implanting ions into a masked substrate so that the implanted ions convert the unmasked portions of the substrate into amorphous silicon carbide. The amorphous silicon carbide may be etched using at least one etchant which etches amorphous silicon carbide relatively quickly and etches monocrystalline silicon carbide relatively slowly, such as hydrofluoric acid and nitric acid. The amorphizing and removing steps may be repeatedly performed to form deep trenches.

REFERENCES:
patent: 4108715 (1978-08-01), Ishikawa et al.
patent: 4735920 (1988-04-01), Stephanie et al.
patent: 4925805 (1990-05-01), Var Ommen et al.
patent: 4981551 (1991-01-01), Palmour
patent: 5087576 (1992-02-01), Edmond et al.
patent: 5270244 (1993-12-01), Baliga
Wolf, S. et al. Silicon Processing for the VLSI Era: vol. 1, Process Technology Lattice Press, pp. 292-293 & 321, 1986.
Trew, Yan and Mock, "The Potential of Diamond and SiC Electronic Devices for Microwave and Millimeter-Wave Power Applications," Proceedings of the IEEE, vol. 79, No. 5, pp. 598-620, May, 1991.
Bhatnagar and Baliga, "Analysis of Silicon Carbide Power Device Performance", IEEE, pp. 176-180, 1991.
Pan and Steckl, "Reaction Ion Etching of SiC Thin Films by Mixtures of Fluorinated Gases and Oxygen", J. Electrochem. Soc., vol. 137, No. 1, pp. 212-220, Jan., 1990.
Davis, "Epitaxial Growth and Doping of and Device Development in Monocrystalline .beta.-SiC Semiconductor Thin Films," Thin Solid Films, vol. 181, pp. 1-15, Dec., 1989.
Shenai, Scott and Baliga, "Optimum Semiconductors for High-Power Electronics", IEEE Transactions on Electron Devices, vol. 36, No. 9, pp. 1811-1823, Sep., 1989.
Bumgarner, Kong, and Kim, et al., "Monocrystalline .beta.-SiC Semiconductor Thin Films: Epitaxial Growth, Doping, and FET Device Development," 1988 Proceedings of the 38th Electronics Components Conf., pp. 342-349, 1988.
Daimon, Yamanaka, Shinohara, Sakuma, Misawa, Endo and Yoshida, "Operation of Schottky-Barrier Field Effect Transistors of 3C-SiC up to 400.degree. C.", Appl. Phys. Lett., vol. 51, pp. 2106-2108, Dec., 1987.
Kelner, Binari, Sleger and Kong, ".beta.-SiC MESFET's and Buried Gate JFET's", IEEE Electron Device Letters, vol. EDL-8, No. 9, pp. 428-430, Sep. 1987.
Kong, Palmour, Glass and Davis, "Temperature Dependence of the Current-Voltage Characteristics of Metal-Semiconductor . . . Via Chemical Vapor Deposition", Appl. Phys. Lett., vol. 51, pp. 442-444, Aug., 1987.
Kelner, Binari, Sleger and Kong, ".beta.-SiC MESFETs", Mater. Res. Soc. Symp. Proc., vol. 97, pp. 227-232, Sep., 1987.
Edmond, Palmour, and Davis, "Chemical Etching of Ion Implanted Amorphous Silicon Carbide," J. Electrochem. Soc.: Solid-State Science and Technology, pp. 650-652, Mar., 1986.
Sugiura, Lu, Cadien and Steckl, "Reactive Etching of SiC Thin Films Using Fluorinated Gases", J. Vac. Sci. Technology. B 4 (1), pp. 349-355, Jan.-Feb., 1986.
Chang, Fang, Huong, and Wu, "Noval Passivation Dielectrics--The Boron-or Phosphorus-Doped Hydrogenated Amorphous Silicon Carbide Films", J. Electro Chem. Soc.: Solid State Science and Technology, pp. 418-422, Feb., 1985.
McHargue, Lewis, Williams and Appleton, "The Reactivity of Ion-Implanted SiC", Materials Science and Engineering, vol. 69, pp. 391-395, 1985.
Palmour, Davis, Astell-Burt and Blackborow, "Effects of Cathode Materials and Gas Species on the Surface Characteristics of Dry Etched Monocrystalline Beta-SiC Thin Films", Silicon Carbide, pp. 491-550 (date unknown).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of forming trenches in monocrystalline silicon carbide does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of forming trenches in monocrystalline silicon carbide, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming trenches in monocrystalline silicon carbide will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-739222

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.