Method of forming thin-film structure by oblique-angle...

Coating processes – Direct application of electrical – magnetic – wave – or... – Electromagnetic or particulate radiation utilized

Reexamination Certificate

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C427S597000, C427S165000, C427S166000, C427S294000, C427S376200

Reexamination Certificate

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07998539

ABSTRACT:
A method of forming thin-film structure by oblique-angle deposition is provided. The method includes the steps of: evaporating target source in a chamber by an electron beam evaporation system, and introducing process gas into the chamber and adjusting tilt angle of the evaporation substrate and controlling temperature in the chamber during evaporation to form thin-film on a evaporation substrate by oblique-angle deposition, and then annealing the evaporation substrate to form a thin-film having porous nanorod microstructure.

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patent: 2008/0192347 (2008-08-01), Yun et al.
Ye, D-X, et al., “Uniform Si nanostructures grown by oblique angle deposition with substrate swing rotation”. Nanotechnology 16 (2005) pp. 1717-1723.
Wright, Michael, “Recent developments in the production of thin-film magnetic media by electron beam evaporation”. J. Vac. Sci. Technol. A 5(1), Jan./Feb. 1987 pp. 57-60.
Pyun, M.W., et al., “Oblique angle deposition of TiO2 thin films prepared by electron-beam evaporation”. Applied Surface Science (2010), doi:10.1016/j.apsusc.2010.08.038, pp. 1-13.
Wang, Sumei, et al., “ZnS thin films fabricated by electron beam evaporation with glancing angle deposition”. 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, edited by Proc. of SPIE vol. 6149, 6149L1-5, (2006).

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