Fishing – trapping – and vermin destroying
Patent
1994-10-14
1996-06-25
Quach, T. N.
Fishing, trapping, and vermin destroying
437192, 437195, H01L 21283
Patent
active
055299539
ABSTRACT:
A method of manufacturing a semiconductor device having a stud and interconnect in a dual damascene structure uses selective deposition. The method includes forming a trench including a first opening portion and a second opening portion in a dielectric layer, forming a first adhesion layer on a surface exposed by the first opening portion, forming a second adhesion layer on a surface exposed by the second opening portion, and selectively depositing a conductive material on the first adhesion layer and the second adhesion layer, wherein growth of the conductive material on the second adhesion layer starts after growth of the conductive material on the first adhesion layer has started. The first and second adhesion layers are of different materials.
REFERENCES:
patent: 4789648 (1988-12-01), Chow et al.
patent: 4837051 (1989-06-01), Farb et al.
patent: 4920070 (1990-04-01), Mukai
patent: 4987099 (1991-01-01), Flanner
patent: 5026666 (1991-06-01), Hills et al.
patent: 5034347 (1991-07-01), Kakihana
patent: 5055423 (1991-10-01), Smith et al.
patent: 5091339 (1992-02-01), Carey
patent: 5093279 (1992-03-01), Andreshak et al.
patent: 5106780 (1992-04-01), Higuchi
patent: 5114879 (1992-05-01), Madan
patent: 5169802 (1992-12-01), Yeh
patent: 5198389 (1993-03-01), Andreas et al.
patent: 5204286 (1993-04-01), Doan
patent: 5240879 (1993-08-01), De Bruin
patent: 5262354 (1993-11-01), Cote et al.
patent: 5266446 (1993-11-01), Chang et al.
patent: 5312777 (1994-05-01), Cronin et al.
"Electroless Plating for Low-Cost High-Leverage Wiring", IBM Technical Disclosure Bulletin, vol. 32, No. 3A, Aug. 1989, pp. 344-345.
"Temporary Contact Protection For A Single Mask, Gate Electrode And Diffusion Borderless Contact Process" IBM Technical Disclosure Bulletin, vol. 32, No. 7, Dec. 1989, pp. 118-119.
Quach T. N.
Toshiba America Electronic Components Inc.
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