Method of forming semiconductor package

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Making plural separate devices

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257SE33066

Reexamination Certificate

active

07745260

ABSTRACT:
A method of forming a semiconductor package (10) including forming a plurality of cavities (14) in a substrate (12). An electrically conductive pattern (16) is formed on the substrate (12) and over the cavities (14). An electrically insulating layer (22) is formed over the substrate (12) and the electrically conductive pattern (16). A plurality of vias (24) is formed in the electrically insulating layer (22). An integrated circuit (IC) die (28) is attached to the electrically insulating layer (22) and electrically connected to the vias (24) such that the IC die (28) is connected to the electrically conductive pattern (16). A molding operation is performed to encapsulate the IC die (28). The substrate (12) is removed such that the electrically conductive pattern (16) is exposed.

REFERENCES:
patent: 4259436 (1981-03-01), Tabuchi
patent: 6100112 (2000-08-01), Amano
patent: 6344688 (2002-02-01), Wang
patent: 6911729 (2005-06-01), Chikawa
patent: 7315086 (2008-01-01), Kim
patent: 2002/0000829 (2002-01-01), Akram et al.
patent: 2008/0199980 (2008-08-01), Okayama

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of forming semiconductor package does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of forming semiconductor package, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming semiconductor package will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4223168

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.