Method of forming semiconductor hetero interfaces

Fishing – trapping – and vermin destroying

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437238, 437239, 437919, 437939, 148DIG118, 148DIG14, 117 95, 117106, 117935, H01L 2120

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active

054223067

ABSTRACT:
A method is disclosed of forming semiconductor hetero interfaces that will contribute to the performance improvement of devices having semiconductor hetero interfaces such as MOS transistors, quantum devices, capacitors and the like. The method comprises the steps of making the surface of a semiconductor substrate clean and flat in terms of atomic level by heating said semiconductor substrate in vacuum to a temperature at which reconstruction of the surface atoms of said semiconductor substrate takes place, then forming a structural buffer layer such as a native oxide layer and the like on said semiconductor substrate surface after the temperature of said semiconductor substrate was lowered to room temperature and finally subjecting the semiconductor substrate with said structural buffer layer formed on its surface to a thermal treatment performed in certain specified temperature and atmosphere. Accordingly, the semiconductor substrate surface becomes smooth in terms of atomic level and an ultra smooth semiconductor interface is formed.

REFERENCES:
patent: 3877982 (1975-04-01), Coldren et al.
patent: 3892891 (1975-07-01), Goodman et al.
patent: 5032545 (1991-07-01), Doan et al.
patent: 5042887 (1991-08-01), Yamada
patent: 5124272 (1992-06-01), Saito et al.
patent: 5199994 (1993-04-01), Aoki
patent: 5298452 (1994-03-01), Meyerson
M. Niwa et al., "SiO.sub.2 /Si Interfaces Studied by Scanning Tunneling Microscopy and High Resolution Transmission Electron Microscopy", Journal of the Electrochemical Society, vol. 139, No. 3, at pp. 901-906 (Mar. 1992).
R. Kliese, et al., "Real-time STM investigation of the initial stages of oxygen interaction with Si(100) 2.times.1", Ultramicroscopy 42-44, at 824-831 (1992).
G. S. Higashi, et al., "Ideal Hydrogen Termination of the Si(111) Surface", Appl. Phys. Lett. 56(7), at 656-658 (Feb. 1990).
Satoru Watanabe, et al., "Homogeneous Hydrogen-Terminated Si(111) Surface Formed Using Aqueous HF Solution and Water", Appl. Phys. Lett 59(12), at 1458-1460 (Sep. 1991).
Ph. Avouris and D. Cahill, "STM Studies of Si(100) -2.times.1 Oxidation: Defect Chemistry and Si Ejection", Ultramicroscopy 42-44, at 838-844 (1992).
M. Udagawa, et al., "The Initial Stages of the Oxidation of Si(100) 2.times.1 Studied by STM", Ultramicroscopy 42-44, at 946-951 (1992).
S. Wolf Silicon Processing for the VLSI Era vol. 2: Process Integration; Lattice Press; Sunset Beach, Calif. (1990) pp. 331-333.

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