Method of forming pre-metal dielectric layer of...

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Having substrate registration feature

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257SE23179, C257SE21525

Reexamination Certificate

active

07981762

ABSTRACT:
A method of forming a pre-metal dielectric (PMD) layer of a semiconductor device using a chemical mechanical polishing (CMP) process which can be suitable for easily recognizing an alignment key. Such a method can reduce or otherwise eliminate alignment key erosion due to CMP by previously forming an alignment key pattern of polysilicon in an active region of a semiconductor scribe lane.

REFERENCES:
patent: 5578519 (1996-11-01), Cho
patent: 6232200 (2001-05-01), Chu
patent: 6303458 (2001-10-01), Zhang et al.
patent: 6337262 (2002-01-01), Pradeep et al.
patent: 6440816 (2002-08-01), Farrow et al.
patent: 6673635 (2004-01-01), Hellig et al.
patent: 6716691 (2004-04-01), Evans et al.
patent: 7381508 (2008-06-01), Kang et al.
patent: 7723203 (2010-05-01), Kim
patent: 2001/0039099 (2001-11-01), Coronel et al.
patent: 2005/0031995 (2005-02-01), Kang et al.
patent: 2006/0103035 (2006-05-01), Maruyama

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of forming pre-metal dielectric layer of... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of forming pre-metal dielectric layer of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming pre-metal dielectric layer of... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2649194

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.