Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Having substrate registration feature
Reexamination Certificate
2011-07-19
2011-07-19
Pert, Evan (Department: 2826)
Semiconductor device manufacturing: process
Formation of electrically isolated lateral semiconductive...
Having substrate registration feature
C257SE23179, C257SE21525
Reexamination Certificate
active
07981762
ABSTRACT:
A method of forming a pre-metal dielectric (PMD) layer of a semiconductor device using a chemical mechanical polishing (CMP) process which can be suitable for easily recognizing an alignment key. Such a method can reduce or otherwise eliminate alignment key erosion due to CMP by previously forming an alignment key pattern of polysilicon in an active region of a semiconductor scribe lane.
REFERENCES:
patent: 5578519 (1996-11-01), Cho
patent: 6232200 (2001-05-01), Chu
patent: 6303458 (2001-10-01), Zhang et al.
patent: 6337262 (2002-01-01), Pradeep et al.
patent: 6440816 (2002-08-01), Farrow et al.
patent: 6673635 (2004-01-01), Hellig et al.
patent: 6716691 (2004-04-01), Evans et al.
patent: 7381508 (2008-06-01), Kang et al.
patent: 7723203 (2010-05-01), Kim
patent: 2001/0039099 (2001-11-01), Coronel et al.
patent: 2005/0031995 (2005-02-01), Kang et al.
patent: 2006/0103035 (2006-05-01), Maruyama
Dongbu Hi-Tek Co., Ltd.
Pert Evan
Sherr & Vaughn, PLLC
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