Method of forming polycrystalline silicon TFTs with TiN/Cu/TiN i

Liquid crystal cells – elements and systems – Particular excitation of liquid crystal – Electrical excitation of liquid crystal

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

349 46, G02F 1136

Patent

active

06111619&

ABSTRACT:
The invention provides a TFT LCD structure and method for using copper conductors on polycrystalline silicon TFTs. A top gate TFT architecture is employed with the copper sandwiched between layers of TiN. Conventional photolithographic and wet etch patterning is used for the copper and TiN conductors. Copper metal gates and source/drain electrodes are provided, yielding TFTs of a quality comparable to TFTs employing aluminum electrodes and conductors. A method of fabrication is also disclosed.

REFERENCES:
patent: 5162933 (1992-11-01), Kakuda et al.
patent: 5608557 (1997-03-01), Wu
patent: 5760854 (1998-06-01), Ono et al.
patent: 5815223 (1998-09-01), Watanabe et al.
patent: 5818550 (1998-10-01), Kadota et al.
patent: 5897182 (1999-04-01), Miyawaki
patent: 5939788 (1999-08-01), McTeer
Article entitled, "Development of Aluminum Gate Thin-Film Transistors based on Aluminum Oxide Insulators", by T. Tsukada, MRS Proceeding, Fall 92, Abs. G7.1; Kawachi et al., IEEE Trans. Electron Dev., 41 (1994) 1120.
Article entitled, "P-5: 11-8-and 10.4-in.--Diagonal Color TFT-LCDs with XGA Compatibility", by Sakurai et al., SID 93 Digest, p. 463: Shimada et al., SID 93 Digest, p. 467.
Article entitled, "22.1: A Six-Mask TFT-LCD Process Using Copper-Gate Metallurgy", by P.M. Fryer et al., SID 96 Digest, pp. 333-336.
Article entitled, "Direct Writing and Lift-Off Patterning of Copper Lines at 200.degree. C. Maximum Process Temperature", by C.M. Hong, et al., MRS Proceeding, vol. 471, pp. 35-41, 1997.
Article entitled, "Manufacturability of Chemical Vapor Deposition of Copper" by T. Nguyen, et al., Semicon/Kansai 96 ULSI Technology Seminar, pp. 2829-2833.
Article entitled, "Dry Etching Technique for Subquarter-Micron Copper Interconnects", Y. Igarashi, T. Yamanobe, T. Ito, J. Electrochem. Soc., 142, L36-L37, 1995.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of forming polycrystalline silicon TFTs with TiN/Cu/TiN i does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of forming polycrystalline silicon TFTs with TiN/Cu/TiN i, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming polycrystalline silicon TFTs with TiN/Cu/TiN i will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1254601

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.