Method of forming interlayer connections in integrated...

Optical waveguides – With optical coupler – Particular coupling structure

Reexamination Certificate

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C385S015000, C385S031000, C385S039000, C385S129000, C385S130000, C385S131000, C385S132000, C065S386000, C065S403000, C065S473000

Reexamination Certificate

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10633071

ABSTRACT:
A method and system of forming vertical optical interconnects in optical integrated circuits is disclosed. The method includes forming a first optical transmission layer over a substrate. A first cladding layer is then formed on the first optical transmission layer and portions of the first cladding layer removed to form an angled sidewall in the first cladding layer. An optical interconnect layer is formed on the angled sidewall of the first cladding layer and on an exposed portion of the first optical transmission layer.

REFERENCES:
patent: 3920314 (1975-11-01), Yajima
patent: 3948583 (1976-04-01), Tien
patent: 3992079 (1976-11-01), Giallorenzi
patent: 4372641 (1983-02-01), Johnson et al.
patent: 4568960 (1986-02-01), Petroff et al.
patent: 5124543 (1992-06-01), Kawashima
patent: 5198008 (1993-03-01), Thomas
patent: 5210801 (1993-05-01), Fournier et al.
patent: 5568579 (1996-10-01), Okaniwa
patent: 5673284 (1997-09-01), Congdon et al.
patent: 6491447 (2002-12-01), Aihara
patent: 2001/0026669 (2001-10-01), Nashimoto
patent: 2004/0017962 (2004-01-01), Lee et al.

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