Fishing – trapping – and vermin destroying
Patent
1996-10-04
1998-01-20
Breneman, R. Bruce
Fishing, trapping, and vermin destroying
15666111, 216 46, 216 47, H01L 21302
Patent
active
057100667
ABSTRACT:
Sidewalls of patterned resist are reformed using a reforming agent selected from the group consisting of (a) a carbon trichloride radical, (b) a mixture of silicon ion and oxygen ion, (c) a mixture of carbon ion and carbon monoxide ion, (d) a chlorine radical, (e) aluminum trichloride liquid and (f) dibutyl magnesium liquid, and sidewall reformed portions are thus formed on the sidewalls of pattern resist. The not reformed portion of the patterned resist is removed away, and sidewall reformed portions are left on an object layer. The portion of object layer excluding the portion immediately below sidewall reformed portions is etched away, and fine patterns of object layer are formed as a result.
REFERENCES:
patent: 4502914 (1985-03-01), Trumpp et al.
patent: 4648937 (1987-03-01), Ogura et al.
patent: 4803181 (1989-02-01), Buchmann et al.
patent: 4838991 (1989-06-01), Cote
patent: 4871630 (1989-10-01), Giammarco et al.
patent: 5023203 (1991-06-01), Choi
patent: 5296410 (1994-03-01), Yang
patent: 5328810 (1994-07-01), Lowrey et al.
patent: 5342481 (1994-08-01), Kadomura
"VLSI Fabrication Principles--Silicon And Gallium Arsenide"; Sorab K. Ghandi; John Wiley & Sons; N.Y., N.Y; .COPYRGT.1983; pp. 422-424.
"Applications of Plasma Proceses to VLSI Technology," Sugano, John Wiley and Sons, pp. 4-9.
"Semiconductor Devices Physics and Technology," S.M. SzE, John Wiley and Sons, pp. 436-442.
Kawazu Satoru
Nishioka Tadashi
Okamoto Chikayuki
Breneman R. Bruce
Goudreau George
Mitsubishi Denki & Kabushiki Kaisha
Ryoden Semiconductor System Engineering Corporation
LandOfFree
Method of forming fine patterns does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of forming fine patterns, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming fine patterns will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-724943