Semiconductor device manufacturing: process – Having magnetic or ferroelectric component
Reexamination Certificate
2011-06-14
2011-06-14
Toledo, Fernando L (Department: 2895)
Semiconductor device manufacturing: process
Having magnetic or ferroelectric component
C438S256000, C257S295000, C257S421000, C257SE29139, C257SE43001, C365S158000
Reexamination Certificate
active
07960186
ABSTRACT:
The disclosure provides a method of forming a ferromagnetic material, including: forming a magnetic element layer on a semiconductor layer formed on an inhibition layer; and forming a ferromagnetic layer of a Heusler alloy layer on the inhibition layer by heat treatment to induce the semiconductor layer and the magnetic element layer to react with each other, and a transistor, and a method of manufacturing the same. The inhibition layer for inhibiting a reaction of the semiconductor layer and the magnetic element layer restricts a semiconductor to be supplied for a reaction of the semiconductor and the magnetic element. Therefore, it is possible to form a ferromagnetic material having a high composition ratio of a magnetic element.
REFERENCES:
patent: 5861069 (1999-01-01), Lee
patent: 7570510 (2009-08-01), Johnson
patent: 7602636 (2009-10-01), Saito et al.
patent: 7652913 (2010-01-01), Sugiyama et al.
patent: 7714400 (2010-05-01), Sugahara et al.
patent: 2004/0052006 (2004-03-01), Odagawa et al.
patent: 2005/0088787 (2005-04-01), Takahashi et al.
patent: 2006/0220161 (2006-10-01), Saito et al.
patent: 2008/0061332 (2008-03-01), Saito et al.
patent: 2008/0061869 (2008-03-01), Takatori
patent: 2009/0236646 (2009-09-01), Sugahara et al.
patent: A-10-183349 (1998-07-01), None
patent: A-2005-228998 (2005-08-01), None
patent: A-2006-286726 (2006-10-01), None
Koichiro Inomata, “Chapter 12 Half Metal Usumaku to TMR,” Spinelectronics-Basic and Forefront, First Edition, CMC Publishing Co., Ltd., 2004, pp. 141-153.
T. Ambrose et al., “Magnetic Properties of Single Crystal Co2MnGe Heusler Alloy Films,” Journal of Applied Physics, vol. 87, No. 9, 2000, pp. 5463-5465.
M. P. Raphael et al., “Magnetic, Structural, and Transport Properties of Thin Film and Single Crystal Co2MnSi,” Applied Physics Letters, vol. 79, No. 26, 2001, 2001, pp. 4396-4398.
S. Sugahara, “Spin Metal-Oxide-Semiconductor Field-Effect Transistors (Spin MOSFETs) For Intergrated Spin Electronics,” IEE Proceedings-Circuits, Devices and Systems, vol. 152, No. 4, 2005, pp. 355-365.
S. Sugahara, “Perspective on Field-Effect Spin-Transistors,” Phys. Stat. Sol., (c) 3, No. 12, 2006, pp. 4405-4413.
Sugahara Satoshi
Takamura Yota
Oliff & Berridg,e PLC
Tokyo Institute of Technology
Toledo Fernando L
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