Method of forming device isolation film of semiconductor device

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Grooved and refilled with deposited dielectric material

Reexamination Certificate

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Details

C438S427000, C438S433000, C438S435000, C438S445000, C438S788000, C257SE21324, C257SE21538, C257SE21546, C257SE21549, C257SE21551

Reexamination Certificate

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07666755

ABSTRACT:
A method of forming a device isolation film of a semiconductor device is provided. The method of forming a device isolation film of a semiconductor device according to an embodiment includes forming the device isolation film by ion-implanting insulation materials inside of a trench formed on a semiconductor substrate.

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