Method of forming contact plug in semiconductor

Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching

Reexamination Certificate

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Details

C438S723000, C438S751000, C438S970000, C257SE21477, C257S483000

Reexamination Certificate

active

07576011

ABSTRACT:
A method of forming a contact plug in a semiconductor device includes the steps of forming a plurality of select lines and a plurality of word lines on a semiconductor substrate; forming a first etching stop layer on the select lines and the word lines; forming a second etching stop layer on the first etching stop layer; forming an insulating layer on the second etching stop layer; removing the insulating layer placed between the select lines, the second etching stop layer and the first etching stop layer to form a contact hole through which a portion of the semiconductor substrate is exposed; and filling the contact hole with conductive material to form a contact plug, and so the nitride layer is thinly formed and the high dielectric layer is then formed to form the etching stop layer. Due to the above, a layer stress caused by the nitride layer can be minimized, and it is possible to resolve a problem of exposing the semiconductor substrate caused by a damage of the etching stop layer.

REFERENCES:
patent: 2003-152116 (2003-05-01), None
patent: 2006-121036 (2006-05-01), None
patent: 1020060045790 (2006-05-01), None
patent: 100632634 (2006-09-01), None
Notice of Allowance of the Korean Patent Application No. 2006-136286.

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