Electrolysis: processes – compositions used therein – and methods – Electrolytic coating – Coating has specified thickness variation
Patent
1990-06-05
1992-01-14
Tufariello, T. M.
Electrolysis: processes, compositions used therein, and methods
Electrolytic coating
Coating has specified thickness variation
205125, 205266, C25D 502
Patent
active
050807633
ABSTRACT:
A method of forming conductor lines of a semiconductor device comprises a step of depositing (electroplating) a gold (Au) layer on an underlying barrier conductive layer in a gold plating bath. According to the present invention, the plating bath is supplemented with an additive in amount such that a lead (iron or nickel) concentration of the bath is form 0.7 to 10 ppm, whereby a deposition rate of the gold near a patterned resist layer is lowered, in comparison with that at the center part of the uncovered conductive layer. The gold plated layer has round edges at the both corners thereof, and therefore, when a protective insulating layer is formed over the gold plated layer, the round edges improve the step coverage of and prevent the appearance of cracks in the protective layer.
REFERENCES:
patent: 4767507 (1988-08-01), Wilkinson
Fujitsu Limited
Tufariello T. M.
LandOfFree
Method of forming conductor lines of a semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of forming conductor lines of a semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming conductor lines of a semiconductor device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-539193