Method of forming capacitors in a semiconductor device

Semiconductor device manufacturing: process – Making passive device – Stacked capacitor

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438250, 438393, H01L 2120

Patent

active

060838051

ABSTRACT:
A method of forming capacitors in a semiconductor device, involves providing a first insulating layer, providing a first mask with an array of apertures over the insulating layer, and etching an array of holes in the first insulating layer through said apertures in said first mask. A first electrode layer extending into the holes is formed over the first insulating layer. A second dielectric layer extends into the holes on said first electrode layer. A second electrode layer extends into the holes on the dielectric layer. The capacitors are patterned with a second mask. The capacitors can be subsequently connected into the circuit in a sequence of processing steps that only involve the addition two extra masks beyond those conventionally employed in integrated circuit manufacture.

REFERENCES:
patent: 5576240 (1996-11-01), Radosevich et al.
patent: 5858832 (1999-01-01), Pan
patent: 5985731 (1999-11-01), Weng et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of forming capacitors in a semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of forming capacitors in a semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming capacitors in a semiconductor device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1485739

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.