Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2007-04-10
2007-04-10
Dang, Phuc T. (Department: 2818)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
C438S618000, C257S208000
Reexamination Certificate
active
11025750
ABSTRACT:
This invention provides a method of forming at least one thin film device, such as for example a thin film transistor. The method includes providing a substrate and depositing a plurality of thin film device layers upon the substrate. An imprinted 3D template structure is provided upon the plurality of thin film device layers. The plurality of thin film layers and 3D template structure are etched and at least one thin film layer is undercut.
REFERENCES:
patent: 5346850 (1994-09-01), Kaschmitter et al.
patent: 6613243 (2003-09-01), Ricks
patent: 6808646 (2004-10-01), Jeans
patent: 2003/0140317 (2003-07-01), Brewer et al.
patent: 2004/0002216 (2004-01-01), Taussig et al.
patent: 2004/0217085 (2004-11-01), Jeans
Kim Han-Jun
Mei Ping
Taussig Carl P.
Dang Phuc T.
Hewlett--Packard Development Company, L.P.
LandOfFree
Method of forming at least one thin film device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of forming at least one thin film device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming at least one thin film device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3760103