Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Grooved and refilled with deposited dielectric material
Reexamination Certificate
2005-01-04
2005-01-04
Zarneke, David A. (Department: 2827)
Semiconductor device manufacturing: process
Formation of electrically isolated lateral semiconductive...
Grooved and refilled with deposited dielectric material
C438S428000, C438S435000, C438S436000, C438S438000
Reexamination Certificate
active
06838356
ABSTRACT:
The present invention provides a method of forming a trench isolation in a substrate, which comprises the steps of: forming a trench groove in a substrate; forming a first electrically insulating layer which fills the trench groove and extends over an upper surface of the substrate, wherein the first electrically insulating layer has a first surface migration, and an upper surface of the first electrically insulating layer has a first hollow positioned over the trench groove; and forming a second electrically insulating layer over the first electrically insulating layer, wherein the second electrically insulating layer fills the first hollow, and an upper surface of the second electrically insulating layer has a second hollow positioned over the trench groove, and the second electrically insulating layer has a second surface migration smaller than the first surface migration.
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NEC Electronics Corporation
Young & Thompson
Zarneke David A.
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