Metal working – Method of mechanical manufacture – Assembling or joining
Patent
1981-10-01
1983-09-20
Ozaki, G.
Metal working
Method of mechanical manufacture
Assembling or joining
29578, 29591, H01L 21363
Patent
active
044047312
ABSTRACT:
In the formation of a thin film device, integrity of the semiconductor-insulator and semiconductor-conductor interfaces is preserved by depositing layers of insulator, semiconductor, and conductor in successive sequence under continuous vacuum. In a preferred embodiment, the method minimizes contamination exposure of the critical interfaces between semiconductor and gate insulator and semiconductor and source-drain contacts of a thin film transistor.
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"Effect of Ion Implantation on CdSe Thin Film Transistors", Shepherd et al. J. Vac. Sci. Technol., vol. 18, No. 3,-Apr. 1981-pp. 899-902.
"Effect of Thermal Annealing on Thin Film Transistors Processed by Photoengraving", Shepherd et al., J. Vac. Sci. Technol., vol. 17, No. 1,-Jan./Feb. 1980, pp. 485-488.
Chittum Robert A.
Mason John B.
Ozaki G.
Xerox Corporation
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