Method of forming a sputtering target

Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Responsive to electromagnetic radiation

Reexamination Certificate

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C438S084000, C438S102000, C257S184000, C257SE21090

Reexamination Certificate

active

08076174

ABSTRACT:
A sputtering target, including a sputtering layer and a support structure. The sputtering layer includes an alkali-containing transition metal. The support structure includes a second material that does not negatively impact the performance of a copper indium selenide (CIS) based semiconductor absorber layer of a solar cell. The sputtering layer directly contacts the second material.

REFERENCES:
patent: 2890419 (1955-03-01), Hagan
patent: 4356073 (1982-10-01), McKelvey
patent: 5415927 (1995-05-01), Hirayama et al.
patent: 5435965 (1995-07-01), Mashima et al.
patent: 5480695 (1996-01-01), Tenhover et al.
patent: 5522535 (1996-06-01), Ivanov et al.
patent: 5626688 (1997-05-01), Probst et al.
patent: 5744252 (1998-04-01), Rasky et al.
patent: 5814195 (1998-09-01), Lehan et al.
patent: 5904966 (1999-05-01), Lippens
patent: 5994163 (1999-11-01), Bodeg.ang.rd et al.
patent: 6020556 (2000-02-01), Inaba et al.
patent: 6300556 (2001-10-01), Yamagishi et al.
patent: 6310281 (2001-10-01), Wendt et al.
patent: 6372538 (2002-04-01), Wendt et al.
patent: 6500733 (2002-12-01), Stanbery
patent: 6525264 (2003-02-01), Ouchida et al.
patent: 6559372 (2003-05-01), Stanbery
patent: 6593213 (2003-07-01), Stanbery
patent: 6690041 (2004-02-01), Armstrong et al.
patent: 6736986 (2004-05-01), Stanbery
patent: 6750394 (2004-06-01), Yamamoto et al.
patent: 6755948 (2004-06-01), Fukuyo et al.
patent: 6787692 (2004-09-01), Wada et al.
patent: 6797874 (2004-09-01), Stanbery
patent: 6822158 (2004-11-01), Ouchida et al.
patent: 6852920 (2005-02-01), Sager et al.
patent: 6878612 (2005-04-01), Nagao et al.
patent: 6881647 (2005-04-01), Stanbery
patent: 6936761 (2005-08-01), Pichler
patent: 6987071 (2006-01-01), Bollman et al.
patent: 7045205 (2006-05-01), Sager
patent: 7115304 (2006-10-01), Roscheisen et al.
patent: 7122392 (2006-10-01), Morse
patent: 7122398 (2006-10-01), Pichler
patent: 7141449 (2006-11-01), Shiozaki
patent: 7148123 (2006-12-01), Stanbery
patent: 7163608 (2007-01-01), Stanbery
patent: 7194197 (2007-03-01), Wendt et al.
patent: 7196262 (2007-03-01), Gronet
patent: 7227066 (2007-06-01), Roscheisen et al.
patent: 7235736 (2007-06-01), Buller et al.
patent: 7247346 (2007-07-01), Sager et al.
patent: 7253017 (2007-08-01), Roscheisen et al.
patent: 7259322 (2007-08-01), Gronet
patent: 7262392 (2007-08-01), Miller
patent: 7267724 (2007-09-01), Tanaka et al.
patent: 7271333 (2007-09-01), Fabick et al.
patent: 7291782 (2007-11-01), Sager et al.
patent: 7306823 (2007-12-01), Sager et al.
patent: 7319190 (2008-01-01), Tuttle
patent: 7374963 (2008-05-01), Basol
patent: 7605328 (2009-10-01), Sager et al.
patent: 2005/0109392 (2005-05-01), Hollars
patent: 2006/0096537 (2006-05-01), Tuttle
patent: 2007/0062805 (2007-03-01), Mayer et al.
patent: 2007/0074969 (2007-04-01), Simpson et al.
patent: 2007/0269963 (2007-11-01), Cheng et al.
patent: 2007/0283996 (2007-12-01), Hachtmann et al.
patent: 2007/0283997 (2007-12-01), Hachtmann et al.
patent: 2007/0289624 (2007-12-01), Kuriyagawa et al.
patent: 2008/0000518 (2008-01-01), Basol
patent: 2008/0053519 (2008-03-01), Pearce et al.
patent: 2008/0110491 (2008-05-01), Buller et al.
patent: 2008/0142071 (2008-06-01), Dorn et al.
patent: 2008/0193798 (2008-08-01), Lemon et al.
patent: 2008/0271781 (2008-11-01), Kushiya et al.
patent: 2008/0283389 (2008-11-01), Aoki
patent: 2008/0308147 (2008-12-01), Lu et al.
patent: 2008/0314432 (2008-12-01), Paulson et al.
patent: 2009/0014049 (2009-01-01), Gur et al.
patent: 2009/0014057 (2009-01-01), Croft et al.
patent: 2009/0014058 (2009-01-01), Croft et al.
patent: 2009/0223556 (2009-09-01), Niesen et al.
patent: 2011/0005587 (2011-01-01), Auvray et al.
patent: 11-274534 (1999-10-01), None
patent: 11-298016 (1999-10-01), None
U.S. Appl. No. 12/314,519, filed Dec. 11, 2008, Hollars et al.
U.S. Appl. No. 12/379,427, filed Feb. 20, 2009, Schmidt, Chris.
U.S. Appl. No. 12/379,428, filed Feb. 20, 2009, Schmidt, Chris.
U.S. Appl. No. 12/385,572, filed Apr. 13, 2009, Mackie et al.
U.S. Appl. No. 12/385,570, filed Apr. 13, 2009, Juliano et al.
Bodegard et al., “The influence of sodium on the grain structure of CuInSo2films for photovoltaic applications,” 12th European Photovoltaic Solar Energy Conference, Proceedings of the International Conference, Amsterdam, The Netherlands, Apr. 11-15, 1994, Hill et al. Ed., vol. II, 1743-1746.
Contreras et al., “On the role of Na and modifications to Cu(In,Ga)Se2absorber materials using thin-MF (M=Na, K, Cs) precursor layers,” 26thIEEE PVSC, Anaheim, California, Sep. 30-Oct. 3, 1997, 359-362.
Devaney et al., “Recent improvement in CuInSe2/ZnCdS thin film solar cell efficiency,” 18th IEEE Photovoltaic Spec. Conf., 1985, New York, 1733-1734.
Evbuomwan et al., “Concurrent materials and manufacturing process selection in design function deployment, Concurrent Engineering: Research and Applications,” Jun. 1995, 3(2):135-144.
Granath et al., “Mechanical issues of NO back contracts for Cu(In,Ga)Se2devices,” 13th European Photovoltaic Solar Energy Conference, Proceedings of the International Conference, Nice, France, Oct. 23-27, 1995, Frelesleben et al. Ed., vol. II, 1983-1986.
Hedström et al., “ZnO/CdS/Cu(In,Ga)Se2thin film solar cells with improved performance,” 23rdIEEE Photovoltaic Specialists Conference, Louisville, Kentucky, May 10-14, 1993, 364-371.
Holz et al., “The effect of substrate impurities on the electronic conductivity in CIS thin films,” 12thEuropean Photovoltaic Solar Energy Conference, Proceedings of the International Conference, Amsterdam, The Netherlands, Apr. 11-15, 1994, Hill et al. Ed., vol. II, 1592-1595.
Mickelsen et al., “High photocurrent polycrystalline thin-film CdS/CulnSe2solar cell,” Appl. Phys. Lett., Mar. 1, 1980, 36(5):371-373.
Mohamed et al., “Correlation between structure, stress and optical properties in direct current sputtered molybdenum oxide films,” Thin Solid Films, 2003, 429:135-143.
Probst et al., “The impact of controlled sodium incorporated on rapid thermal processed Cu(InGa)Se2-thin films and devices,” First WCPEC, Hawaii, Dec. 5-9, 2004, 144-147.
Ramanath et al., “Properties of 19.2% Efficiency ZnO/CdS/CuInGaSe2Thin-film Solar Cells,” Progress in Photovoltaics: Research and Applications, 2003, 11:225-230.
Rau et al., “Cu(In,Ga)Se2solar cells,” Clean Electricity From Photovoltaics, Series on Photoconversion of Solar Energy, vol. 1, 2001, Archer et al. Ed., Chapter 7, 277-345.
Rudmann et al., “Effects of NaF coevaporation on structural properties of Cu(In,Ga)Se2thin films,” Thin Solid Films, 2003, 431-432:37-40.
Sakurai et al,. “Properties of Cu(In,Ga)Se2:Fe Thin Films for Solar Cells,” Mater. Res. Soc. Symp. Proc., 2005, 865:F14.12.1-F.14.12.5.
Scofield et al., “Sodium diffusion, selenization, and microstructural effects associated with various molybdenum back contact layers fo Cis-based solar cells,” Proc. of the 24thIEEE Photovoltaic Specialists Conference, New York, 1995, 164-167.
So et al., “Properties of Reactively Sputtered Mo1-xOxFilms,” Appl. Phys. A, 1988, 45:265-270.
Stolt et al., “ZnO/CdS/CulnSe2thin-film solar cells with improved performance,” Appl. Phys. Lett., Feb. 8, 1993, 62(6):597-599.
Windischmann, Henry, “Intrinsic Stress in Sputter-Deposited Thin Films,” Critical Reviews in Solid State and Materials Science, 1992, 17(6):547-596.
Yun et al., “Fabrication of CIGS solar cells with a Na-doped Mo layer on a Na-free substrate,” Thin Solid Films, 2007, 515:5876-5879.
International Search Report and Written Opinion, International Application PCT/US2010/030458. International Searching Authority: Korean Intellectual Property Office (ISA/KR), Nov. 19, 2010.

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