Metal treatment – Compositions – Heat treating
Patent
1985-08-05
1987-05-05
Roy, Upendra
Metal treatment
Compositions
Heat treating
29576B, 29576T, 148187, 148DIG93, 156612, 156620, 427 531, H01L 21263, H01L 21208
Patent
active
046629491
ABSTRACT:
In an apparatus for forming a single crystal semiconductor layer from a non-single-crystalline semiconductor material by scanning a region of the material with an electron beam, a first pair of deflection electrodes and a second pair of deflection electrodes, both pairs being provided in the path of the electron beam. A deflection signal generated by modifying the amplitude of a high-frequency fundamental wave signal with a modulation wave signal having a frequency lower than that of the high-frequency fundamental wave signal is supplied to the deflection electrodes of the first pair. The electrodes rapidly deflect the electron beam in a first direction, while changing the range of deflecting the beam, thereby forming a locus of the beam spot on the sample. Simultaneously, the deflection electrodes of the second pair deflect the beam in a second direction, thereby annealing a region of the material, to form a single crystal semiconductor layer.
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Zorabedian et al. in Mat. Res. Soc. Proc., vol. 13, ed. Narayan et al., N. Holland, N.Y., 1982, p. 523.
Stultz et al., Appl. Phys. Letts.
Hamasaki Toshihiko
Higashinakagawa Iwao
Inoue Tomoyasu
Suguro Kyoichi
Tango Hiroyuki
Director--General of Agency of Industrial Science and Technology
Roy Upendra
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