Method of forming a probe for an atomic force microscope

Details Method of forming a probe for an atomic force microscope Method of forming a probe for an atomic force microscope

1994-06-21

1995-02-14

Gutierrez, Diego F. F.

Undertaking

Body preparation

374142, G01R 300, G01K 114

Patent

active

053883233

ABSTRACT:
A probe (10,30,40) for forming images of surfaces (11) facilitates simultaneous formation of both thermal and atomic force microsocopy images. The probe (10,30,40) includes a heat sensing assembly (15) that has a heat sensing element (19,38,42). An electrically isolating and thermally conductive tip (22,48) projects from the heat sensing assembly. The probe (10) also has a reflective element (24) that is positioned between a first end of the heat sensing assembly (15) and the electrically isolating and thermally conductive tip (22).

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