Fishing – trapping – and vermin destroying
Patent
1994-02-01
1995-01-24
Breneman, R. Bruce
Fishing, trapping, and vermin destroying
437235, 437240, 437978, 437982, 148DIG133, H01L 21465
Patent
active
053842880
ABSTRACT:
A method for forming a planar insulating layer over the surface of a semiconductor workpiece 8 which includes at least one low region 13 is discussed herein. The first step is to form a layer of blocking material 14 on the surface of the workpiece 8. A first material region 20 is then formed in the low region 13 and an insulating layer 21 is formed over the surface of the workpiece 8 including the first material region 20. The workpiece 8 is then heated in the presence of an active ambient such that the insulation layer 21 reflows and also so that the first material 20 region reacts with the active ambient to create an internal stress in said insulation layer 21. Other systems and methods are also disclosed.
REFERENCES:
patent: 4239559 (1980-12-01), Ito
patent: 4731346 (1988-03-01), Ashwell
patent: 4740480 (1988-04-01), Ooka
patent: 4962063 (1990-10-01), Maydon et al.
patent: 4982250 (1991-01-01), Manos et al.
patent: 5006913 (1991-04-01), Sugahara et al.
patent: 5068711 (1991-11-01), Mise
patent: 5244825 (1993-09-01), Coleman et al.
S. M. Sze, Semiconductor Devices Physics and Technology, John Wiley & Sons, New York (1983) p. 349.
B. E. Deal, "Historical Perspectives of Silicon", The Physics and Chemistry of SiO.sub.2 and the Si-SiO.sub.2 I Interface, Edited by C. Robert Helms and Bruce E. Deal, pp. 5-15 (1988).
S. M. Sze, Semiconductor Devices Physics and Technology, 1985, pp. 341-354.
Breneman R. Bruce
Donaldson Richard L.
Kesterson James C.
Matsil Ira S.
Paladugu Ramamohan Rao
LandOfFree
Method of forming a planarized insulation layer does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of forming a planarized insulation layer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming a planarized insulation layer will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1468548