Method of forming a frontside contact to the silicon substrate o

Fishing – trapping – and vermin destroying

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

437 21, 437 28, 437 34, 437 40, H01L 2144

Patent

active

053148410

ABSTRACT:
A method of having a frontside contact to a SOI wafer is described. Before any device processing steps a trench is etched through the SOI layers to the substrate. This trench is maintained during device processing and opened during source/drain implantation. At metallization an ohmic contact is made to the substrate.

REFERENCES:
patent: 3911465 (1975-10-01), Foss et al.
patent: 4400865 (1983-08-01), Goth et al.
patent: 4479297 (1984-10-01), Mizutani et al.
patent: 4888304 (1989-12-01), Nakagawa et al.
patent: 4980732 (1990-12-01), Okazawa
patent: 5057450 (1991-10-01), Bronner et al.
patent: 5075237 (1991-12-01), Wu
patent: 5081062 (1992-01-01), Vasudev et al.
patent: 5151374 (1992-09-01), Wu
patent: 5166086 (1992-11-01), Takeda et al.
patent: 5185535 (1993-02-01), Farb et al.
patent: 5188973 (1993-02-01), Omura et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of forming a frontside contact to the silicon substrate o does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of forming a frontside contact to the silicon substrate o, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming a frontside contact to the silicon substrate o will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1972501

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.