Method of forming a cadmium telluride/silicon structure

Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Electromagnetic or particle radiation

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257190, H01L 3100, H01L 310328, H01L 310336, H01L 31072

Patent

active

058380531

ABSTRACT:
In one embodiment, a semiconductor structure is disclosed. The structure includes both a silicon and a cadmium telluride layer. Each may have a (100) lattice orientation. A plurality of buffer layers are disposed between the silicon layer and the cadmium telluride layer. Each of these buffer layers has a lattice constant which is greater than the lattice constant of the layer below it and less than the lattice constant of the layer above it. As examples, these buffer layers may comprise zinc sulfide, zinc selenide, zinc telluride or zinc tellurium selenide.

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de Lyon et al., "Direct molecular-beam epitaxial growth of ZnTe(100) and CdZnTe(100)/ZnTe(100) on Si(100) substrates", Applied Physics Lett., vol. 63, No. 6, Aug. 9, 1993, pp. 818-820.
Sporken et al., "Molecular beam epitaxial growth of CdTe and HgCdTe on Si(100)", Applied Physics Lett., vol. 55 (18), Oct. 30, 1989, pp. 1879-1881.

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