Method of finding DC test point of an integrated circuit

Details Method of finding DC test point of an integrated circuit Method of finding DC test point of an integrated circuit

1996-06-25

1998-01-06

Beausoliel, Jr., Robert W.

Excavating

364483, 324765, G01R 3128

Patent

active

057062943

ABSTRACT:
A DC test point finding method includes steps of: displaying a list of all input and output terminals of an integrated circuit; inputting selected terminals among the terminals of the list; inputting a selected test pattern file among a number of stored test pattern files, each test pattern file including a plurality of sequentially occurred test vectors and identified by a name of the test pattern file, the test vectors identified by respective vector numbers; inputting a test point finding condition related to a DC test point; finding the DC test point of the circuit among the selected terminals by using the test vectors of the selected test pattern file and the test point finding condition; and inserting test point data of the DC test point into the list so that the resulting list including the test point data is displayed.

REFERENCES:
patent: 4045736 (1977-08-01), Carpenter et al.
patent: 4313200 (1982-01-01), Nishiura
patent: 4903267 (1990-02-01), Arai et al.
patent: 5389990 (1995-02-01), Nakamura
patent: 5400263 (1995-03-01), Rohrbaugh et al.
patent: 5410247 (1995-04-01), Isizuka

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