Semiconductor device manufacturing: process – Having metal oxide or copper sulfide compound semiconductor...
Reexamination Certificate
2006-12-22
2010-06-22
Nguyen, Ha Tran T (Department: 2829)
Semiconductor device manufacturing: process
Having metal oxide or copper sulfide compound semiconductor...
C438S357000, C438S468000
Reexamination Certificate
active
07741147
ABSTRACT:
A technique for creating high quality Schottky barrier devices in doped (e.g., Li+) crystalline metal oxide (e.g., ZnO) comprises field-controlled diffusion of mobile dopant atoms within the metal oxide crystal lattice. When heated (e.g., above 550 K) in the presence of an electric field (e.g., bias to ground of +/−50 V) the dopant atoms are caused to collect to form an ohmic contact, leaving a depletion region. The size of the depletion region controls the thickness of the Schottky barrier. Metal-semiconductor junction devices such as diodes, photo-diodes, photo-detectors, MESFETs, etc. may thereby be fabricated.
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Kiesel Peter
Schmidt Oliver
Brown Valerie
Nguyen Ha Tran T
Palo Alto Research Center Incorporated
Small Jonathan A.
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